- Country: USA
- Summary: ARC3 Controller with nanoTDDB accessory
- UST Ref No: 113566348
- Deadline: 03 Feb 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NIST-SS25-CHIPS-0048
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- Description:
- Description
*****THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***.
BACKGROUND
The National Institute of Standards and Technology (NIST), Physics Measurement Laboratory/ 686 Division, is focused on precision measurements to support industry innovation. In particular the Applied Physics Division addresses the precise metrology for microwave and quantum photonics and nanophotonics, nanotechnology, nanoscale device and materials characterization, magnetic imaging for health applications and spintronics and its applications.
The requested equipment is for the CHIPS program funded within the quantitative nanoscale characterization group with the focus on breakdown characterization of wide bandgap semiconductor materials and advanced electronic circuits at nanoscale. This requires nanoscale measurement of local defects, interfaces, carrier density, distribution in 2D materials and breakdown voltages in wide bandgap devices within the CHIPS project and materials and devices obtained from the stakeholders.
To be able to develop such a metrology it is necessary for the equipment to have a nanoscale spatial resolution and deliver locally relatively high voltages in the range of tens to hundred volts with additional material characterization after the exposure to high DC voltages. To address the material and/or device changes the equipment must be able to detect the changes in the material properties at the same scale as the caused damage or better. One of the metrology options that can fulfill these requirements is atomic force microscopy with additional accessories. We already own the basic setup of such equipment, but to be able using the equipment with all the necessary functions it requires a special control unit. Our request is for purchase of such advanced control unit.
The requirements are:
It must be compatible with our existing MFP-3D atomic force microscope. It must have a required system firmware ... - Documents:
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CLICK HERE TO LOGINARC3 Controller with nanoTDDB accessory - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for ARC3 Controller with nanoTDDB accessory. This tender is published on USARFP under UST Ref No: 113566348 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-02-03.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
