- Country: USA
- Summary: CHIPS Low Loss Mirrors - Combined Sources Sought/Notice of Intent to Sole Source
- UST Ref No: 115696172
- Deadline: 17 Mar 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NIST-SS25-CHIPS-0071
- Purchaser's Detail:Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details.
- Description:
- Description
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Thorlabs, Inc (43 Sparta Avenue, Newton, NJ 07860) under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334413.
NIST has a need for ten (10) Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coating that meets or exceeds the following requirements.
NIST-s CHIPS Metrology Program includes research in Grand Challenge 1, Metrology for Materials Purity, Properties and Provenance. To address this Grand Challenge, the project Optical Impurity Analysis of Semiconductor Gases for Enhanced Quality Systems seeks to purchase Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings to perform ultrasensitive cavity ring-down and cavity-enhanced spectroscopy on gas-phase samples. The project is led by the Chemical Science Division of the NIST Material Measurement Laboratory, the nation-s premier metrology laboratory for measurement science, standards, technology, and data in the area of chemical sciences.
To improve sensitivity in laser absorption spectroscopy, optical cavities are used to enhance the interaction pathlength between a laser source and a gas-phase sample. Here we aim to detect trace impurities in gas-phase samples relevant to the semiconductor industry. Therefore, we require high reflectivity mirrors with low absorption and scattering loss that efficiently transmit and store laser light. The overall goal is the trace detection of small molecules like nitrous oxide (N2O) and carbon monoxide (CO) in bulk zero gases like nitrogen (N2) and argon (Ar) at the parts-per-trillion level (1 part in 1012)... - Documents:
If you are registered member, kindly login to view full details of this tender notice:
CLICK HERE TO LOGINCHIPS Low Loss Mirrors - Combined Sources Sought/Notice of Intent to Sole Source - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for CHIPS Low Loss Mirrors - Combined Sources Sought/Notice of Intent to Sole Source. This tender is published on USARFP under UST Ref No: 115696172 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-03-17.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
