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CHIPS RD Upgrade of InLine RSoXS through station Combined Sources SoughtNotice of Intent to Sole Source

USARFP notice for CHIPS RD Upgrade of InLine RSoXS through station Combined Sources SoughtNotice of Intent to Sole Source. The reference ID of the tender is 130700319 and it is closing on 05 Dec 2025.

Tender Details

  • Country: USA
  • Summary: CHIPS RD Upgrade of InLine RSoXS through station Combined Sources SoughtNotice of Intent to Sole Source
  • UST Ref No: 130700319
  • Deadline: 05 Dec 2025
  • Financier: Self Financed
  • Purchaser Ownership: Government
  • Tender Value: Refer Document
  • Notice Type: Tender
  • Document Ref. No.: NIST-SS26-CHIPS-15
  • Purchaser's Detail:
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  • Description:
  • BACKGROUND
    ***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
    The National Institute of Standards and Technology (NIST), Materials Measurement Lab is upgrading the resonant soft X-ray scattering (RSoXS) through station at NSLS-II as part of a project in the CHIPS Metrology program. If no alternate sources are identified, the Government intends to issue a Sole Source Award to XDS Oxford Limited; Unit 1, Ferry Mills Osney Mead Oxford, United Kingdom under the authority of FAR 13.106-1(b)(1)(i). The North American Industry Classification System (NAICS) code for this acquisition is 334513.
    NIST Materials Measurement Lab is upgrading the resonant soft X-ray scattering (RSoXS) through station at NSLS-II as part of a project in the CHIPS Metrology program. The through station is used for measuring the microstructure and local chemistry of a variety of soft matter systems including those used in photolithography, organic electronics, water membranes, and biological systems. The through station is operated as part of the general user program at NSLS-II and is available for use through a proposal review system. The through station is situated on the SST1 beamline (https://www.bnl.gov/nsls2/beamlines/beamline.php?r=7-ID-1).
    The RSoXS through station is being upgraded to allow soft X-ray reflectivity and a method called resonant critical dimension small angle scattering (res-CDSAXS). These measurements will enhance the ability of the through station to characterize new materials for photolithography. This requirement necessitates a system with the sample and the detector on a 2-circle goniometer in the vacuum chamber. The upgrade will also add a high throughput sample exchange system to increase the sample throughput of the through station.
    An upgraded RSoXS through station will be installed on the SST1 beamline at NSLS-II. This upgrade will enable the through station to conduct soft X-ray reflectivity and resonant critical dimen...
  • Documents:

 Tender Notice

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CHIPS RD Upgrade of InLine RSoXS through station Combined Sources SoughtNotice of Intent to Sole Source - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for CHIPS RD Upgrade of InLine RSoXS through station Combined Sources SoughtNotice of Intent to Sole Source. This tender is published on USARFP under UST Ref No: 130700319 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-05.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.

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