- Country: USA
- Summary: Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
- UST Ref No: 131566344
- Deadline: 18 Dec 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NIST-SS26-CHIPS-31
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- Description:
- ***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Panoscientific, LLC, 4425 Seneca Ave, Cocoa, FL 32926, US, under the authority of FAR 13.106-1(b)(1)(i). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing.
BACKGROUND
The NIST Physical Measurement Laboratory (PML), Microsystems and Nanotechnology Division (MND), CHIPS R&D Program (https://www.nist.gov/chips/metrology-community) as part of the CHIPS Act activities (Grand Challenge 5: Modeling and Simulating Semiconductor Manufacturing Processes), is now developing imaging and measurement solutions for integrated circuit (IC) overlay metrology using a scanning electron microscope (SEM). IC production relies on measurements of the 3D size, shape, and placement of structures with atomic-level precision and repeatability. The project, titled “SEM Overlay Metrology Based on Physics Model and Artificial Intelligence,” will create a sound scientific foundation and comprehensive solutions for SEM-based overlay and dimensional metrology superior to currently used arbitrary methods. This will allow the design of overlay patterns, acquisition, and image analysis to be optimized entirely through artificial intelligence, physics-based simulation, and modeling and meet IC production requirements now and in the future. For this work, samples that contain patterns used for overlay measurements and relevant to current IC technologies are indispensable.
The NIST MND requires special hardware, a so-called compressed sensing scan generator suitable for SEM-based measurements of IC overlay structures to acquire images significantl... - Documents:
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CLICK HERE TO LOGINCombined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device. This tender is published on USARFP under UST Ref No: 131566344 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-18.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
