- Country: USA
- Summary: Commercial semiautomatic probe stations
- UST Ref No: 131753939
- Deadline: 19 Dec 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NIST-SS26-CHIPS-44
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- Description:
- NIST-SS26-CHIPS-44
PLEASE NOTE THIS A SOURCES SOUGHT NOTICE ONLY
Title: Commercial semi-automatic probe stations
BACKGROUND
Silicon carbide field effect transistors (FETs) have emerged as a superior solution to silicon FETs for high power semiconductor applications. In recent years, the silicon carbide FET industry has grown at a significant rate with applications in photovoltaics, the power grid, electric vehicles, energy storage, and more. Despite the commercial success of these devices, the industry is plagued by reliability problems, often leading to the need for redundancy in integrated systems. Arguably most important among these issues is the extrinsic breakdown characteristics of the FET gate oxide. Studying this problem requires a deep statistical understanding of device behavior, and innovative solutions for pre-screening from the factory. A large-scale, multi-faceted reliability testing platform is required in order to find solutions.
The CHIPS R&D Program Office intends to purchase a 300 mm wafer probing station which will facilitate the study of transistor characteristics, leakage currents, and breakdown behavior of silicon carbide FET gate dielectrics. This purchase aligns with the CHIPS R&D Programs Office-s mission to standardize new materials, processes, and equipment for microelectronics research. The resulting data will be compared to statistical breakdown data obtained through our effort to create a massively parallel testing platform. The data will also be compared to that of industry standard pre-screening tests on identical samples in order to verify or dispute their accuracy. Similar methodology may be applied to other gate oxide reliability problems in the future.
The minimum requirements are as follows:
Line Item 0001:
Description: Insert brief description of item (e.g. Optical Table, Part Number)
Quantity: 1
Technical Specifications
Must be a semiautomatic wafer probing station capable of probing wafers u... - Documents:
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CLICK HERE TO LOGINCommercial semiautomatic probe stations - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Commercial semiautomatic probe stations. This tender is published on USARFP under UST Ref No: 131753939 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-19.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
