- Country: USA
- Summary: Electromagnetic Imaging Modules for an Atomic Force Microscope - Combined Sources Sought/Notice of Intent to Sole Source
- UST Ref No: 124182259
- Deadline: 21 Aug 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NB305000-25-02640
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- Description:
- Description
BACKGROUND
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a high speed, Electromagnetic Imaging Modules for an Atomic Force Microscope. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Liquid Instruments (140 Manning RD, Billerica MA 01821-3915) under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334516.
NIST seeks to develop measurement technologies, properties data, and standards focused on defect and contaminant identification to support uniform materials quality and traceability across the supply chain. As part of this program, NIST requires scanning probe microscopy capabilities to characterize two-dimensional and wide bandgap materials. Specifically, NIST requires four electromagnetic imaging modules that will be integrated with and extend the capabilities of an existing commercial Atomic Force Microscope (AFM). These electromagnetic and electromechanical imaging modules include hardware and software for: (i) Scanning Spreading Resistance Microscopy (SSRM) (ii) Scanning Capacitance Microscopy (SCM) (iii) Tunneling AFM (TUNA) (iv) Kelvin Probe Force Microscopy (KPFM). These imaging modules will be applied to perform comparative microscopy on industrially relevant materials to further semiconductor device reliability. These imaging modules will be used to enable evaluation of two-dimensional and wide bandgap materials to further device reliability. The modules will be deployed in a multi-user environment that prioritizes ease-of-use and interfaces that facilitate measurement and data analysis by multiple users.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described abov... - Documents:
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CLICK HERE TO LOGINElectromagnetic Imaging Modules for an Atomic Force Microscope - Combined Sources Sought/Notice of Intent to Sole Source - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Electromagnetic Imaging Modules for an Atomic Force Microscope - Combined Sources Sought/Notice of Intent to Sole Source. This tender is published on USARFP under UST Ref No: 124182259 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-08-21.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
