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High-Temperature In-Situ (HTIS) Indenter

USARFP notice for High-Temperature In-Situ (HTIS) Indenter. The reference ID of the tender is 110108342 and it is closing on 27 Nov 2024.

Tender Details

  • Country: USA
  • Summary: High-Temperature In-Situ (HTIS) Indenter
  • UST Ref No: 110108342
  • Deadline: 27 Nov 2024
  • Financier: Self Financed
  • Purchaser Ownership: Government
  • Tender Value: Refer Document
  • Notice Type: Tender
  • Document Ref. No.: NIST-SS25-CHIPS-0025
  • Purchaser's Detail:
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  • Description:
  • Description
    The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs.

    BACKGROUND

    The National Institute of Standards and Technology (NIST), Material Measurement Laboratory (MML), Materials Measurement Science Division (MMSD), Nanomechanical Properties Group (https://www.nist.gov/mml/mmsd/nanomechanical-properties-group) determines and disseminates key data to establish the relationship between structure, property, and performance of materials and devices to address current and future needs in semiconductor microelectronics, energy conversion applications, climate research, and additive manufacturing.
    For this project, NIST is aiming to study the deformation behavior and measure mechanical properties (e.g., modulus, creep, yield stress, fracture toughness) of materials (such as, dielectrics and metals) and structures relevant to the semiconductor industry (such as, film stacks and dies). The described mechanical characterization using instrumented indentation will be performed under vacuum conditions at temperatures ranging from room temperature (RT) to 350°C. Furthermore, in-situ observation of the indentation-induced deformation and damages (e.g., cracking, delamination) will be conducted during indentation experiments.
    These high-temperature mechanical tests under vacuum conditions can be accomplished by operating an instrumented indentation device specifically designed for high-temperature (HT) testing inside a scanning electron microscope (SEM).
    The HT in-situ (HTSI) indenter will be predominately installed and operated in a FEI Quanta 200 FEG ESEM. However, the HTSI indenter may also be occasionally installed and operated in a JEOL 7800 or JEOL 7100.
    NIST is seeking information from sources that may be capable of providing a solution that shall achieve the objectives described above, in addition to t...
  • Documents:

 Tender Notice

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High-Temperature In-Situ (HTIS) Indenter - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for High-Temperature In-Situ (HTIS) Indenter. This tender is published on USARFP under UST Ref No: 110108342 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2024-11-27.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.

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