Tender Details

Country: USA
Summary: In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL
UST Ref No: 125599409
Deadline: 08 Sep 2025
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: 140G0225Q0088
Purchaser's Detail:
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Description:
Description
In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL USASpecial Notice of Intent to Award a Sole Source Procurement. THIS IS NOT A REQUEST FOR QUOTE. THIS IS A NOTICE OF THE GOVERNMENT'S INTENT TO ISSUE A SOLE SOURCE AWARD. This Notice is to announce that the U.S. Department of the Interior (DOI), U.S. Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center is proposing to negotiate a contract with JEOL USA, Inc. on a sole source basis for the purchase of a demo unit JEOL JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM).The proposed action is for products/services for which the Government intends to solicit and negotiate with only one source under the authority FAR 13.106-1(b)(1). The reason justifying this sole source procurement is that the Government believes only one responsible source can provide the products/services that will satisfy the agency's requirement.The following is a description of the product that are required but not limited to: 1. Resolution: 0.7nm @20kV, 1.3 nm @ 1kV, 3.0 nm at 15 kV2. Magnification: Photo magnification: ×10 to ×2,000,000 (128 × 96 mm)Display magnification: ×27 to ×5,480,000 (1,280 × 960 pixels)3. Landing voltage: 0.01 to 30 kV4. Probe current and detector: 5 pA to 300 nA (30 kV)5 pA to 100 nA (5 kV)In column probe current detector presentAbsorbed current meter5. Imaging Detectors: Secondary electron detector (SED)Upper electron detector (UED)Low vacuum secondary electron detectorRetractable backscattered electron detectorChamber camera6. Other Detectors: 60 mm SDD EDS DetectorSystem must be compatible with JEOL SXES detector7. Electron gun:In-lens Schottky Plus field emission electron gun8. Emitter warranty period 3 years9. Aperture angle control lens (ACL): Built-in10. Objective lens: Hybrid Lens11. Specimen stage control: Full eucentric goniometer stage, 5-axis motor driveStage movement range - X:70mm Y:50mm Z:1 to 41mm Tilt: -5 to ...
Documents:

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In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL - USA Tender

The INTERIOR, DEPARTMENT OF THE | US GEOLOGICAL SURVEY, a Government sector organization in USA, has announced a new tender for In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL. This tender is published on USARFP under UST Ref No: 125599409 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-09-08.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.