Tender Details

Country: USA
Summary: Interferometry Laser Combined Sources Sought Notice and Notice of Intent to Sole Source
UST Ref No: 132009460
Deadline: 26 Dec 2025
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: NIST-SS26-CHIPS-53
Purchaser's Detail:
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Description:
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Toptica Photonics Inc, 1120 Pittsford Victor Rd, Pittsford, NY, under the authority of FAR 13.106-1(b)(1)(i). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing.
BACKGROUND
As part of the CHIPS R&D Program, the National Institute of Standards and Technology (NIST) Physical Measurement Laboratory (PML), Microsystems and Nanotechnology Division (MND), works on sensing methods using micromechanical resonators to perform critical physical measurements for measurands including acceleration, pressure, sound, and mass. For this procurement, the MND require a tunable laser that will used in mass sensing experiments for atomic layer deposition processes used widely in semiconductor manufacturing.
The MND requires a tunable diode laser operating around a wavelength of 780 nm to perform laser interferometry on microwave acoustic devices. These devices are being used to characterize atomic layer deposition (ALD) processes, providing high time and mass resolution for the deposition dynamics of these processes. This is part of a larger effort to perform high-fidelity process metrology for ALD and use the resulting data sets to build a digital twin of ALD processes. ALD is essential for state-of-the-art semiconductor manufacturing, where it is used to create electrical isolation layers in transistors that are a countable number of atoms thick. The resulting ALD digital twin will allow U.S. manufacturers to optimize process conditions using virtual models, thereby increasing fabrication yield and pushing towards the fundament...
Documents:

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Interferometry Laser Combined Sources Sought Notice and Notice of Intent to Sole Source - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Interferometry Laser Combined Sources Sought Notice and Notice of Intent to Sole Source. This tender is published on USARFP under UST Ref No: 132009460 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-26.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.