Tender Details

Country: USA
Summary: Notice of Intent to Noncompetitively Acquire CHIPS RD Onaxis TEM tomography Holder
UST Ref No: 132010211
Deadline: 26 Dec 2025
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: NB305000-26-00086
Purchaser's Detail:
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Description:
This notice is not a request for a quotation. A solicitation document will not be issued and quotations will not be requested.
This acquisition is being conducted under the authority of FAR 13.106-1(b).
The Material Measurement Laboratory at the National Institute of Standards and Technology (NIST) is involved in the characterization of metals, semiconductors, and insulators in support of the CHIPS Act. Materials characterization allows industrial scientists to make direct correlations between material processing, (nano)structure, and resulting properties. At NIST, the CHIPS atom probe tomography project will study a wide range of materials with an emphasis on nanostructures containing materials relevant to the semiconductor manufacturing industry. In laser-pulsed atom probe tomography a laser pulse is used to trigger field ion evaporation from a nanoscale specimen tip. Over the past decade or so, commercial atom probe instrumentation has evolved towards using shorter wavelengths, which has significantly improved the quality/utility of atom probe data. As part of the CHIPS atom probe tomography project, we explore various wavelengths of light used to trigger field ion evaporation and compare the performance of state-of-the art commercially available tools with our experimental systems. The data from such experiments will allow NIST to determine the optimum wavelength for atom probe tomography characterization of semiconductor industry relevant specimens. These data will inform the next generation of commercial atom probe instruments and improve the analysis capabilities of atom probe tomography in support of the goals of the CHIPS Act.
We require an on-axis transmission electron microscopy (TEM) tomography holder capable of analyzing the wire-based specimens from our CAMECA Invizo 6000 atom probe microscope located at NIST in Boulder CO. The TEM and atom probe microscope are part of a site-wide user facility, and we have practitioners of all abilities using...
Documents:

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Notice of Intent to Noncompetitively Acquire CHIPS RD Onaxis TEM tomography Holder - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Notice of Intent to Noncompetitively Acquire CHIPS RD Onaxis TEM tomography Holder. This tender is published on USARFP under UST Ref No: 132010211 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-26.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.