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Notice of Intent to Sole Source for Coupled Device Detector Camera System

USARFP notice for Notice of Intent to Sole Source for Coupled Device Detector Camera System. The reference ID of the tender is 132131557 and it is closing on 29 Dec 2025.

Tender Details

  • Country: USA
  • Summary: Notice of Intent to Sole Source for Coupled Device Detector Camera System
  • UST Ref No: 132131557
  • Deadline: 29 Dec 2025
  • Financier: Self Financed
  • Purchaser Ownership: Government
  • Tender Value: Refer Document
  • Notice Type: Tender
  • Document Ref. No.: NIST-SS26-CHIPS-54
  • Purchaser's Detail:
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  • Description:
  • Notice ID Number: NIST-SS26-CHIPS-54
    Title: Notice of Intent to Sole Source to Teledyne Digital Imaging
    The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a coupled device detector camera system. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Teledyne Digital Imaging located at 3660 Mercerville Quakerbridge Rd, Trenton, NJ 08619 under the authority of FAR 13.106-1(b); only one source reasonably available. The North American Industry Classification System (NAICS) code for this acquisition is 334516 Analytical Laboratory Instrument Manufacturing.
    BACKGROUND:
    The National Institute of Standards and Technology (NIST), Material Measurement Laboratory (MML) requires a coupled device detector camera system to perform fast OES measurements. The CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project (5.04) was undertaken to identify methods to improve efficiencies of plasma etching processes. One aspect of this project involves development and application of in situ optical diagnostics capable of characterizing plasma chemistry, including dilute species. One optical technique that meets the needs of this project is optical emission spectroscopy (OES) performed with a detector that can be controlled at a speed fast enough to follow the change in emission due to the changes in power coupled into the plasma at 13.56 megahertz. To perform fasts OES measurements, Group 646.05 needs to procure a camera with an integrated intensifier and control/data analysis software. Since dilute species will emit weak signals in (low pressure) plasma etch processes, the detector must have ultra-low noise characteristics as well as a high gain (in addition to the intensifier gain). To meet the requirements of these measurements, an intensified electron multiplication charge coupled device (IEMCCD) camera, and a control/data analysis ...
  • Documents:

 Tender Notice

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Notice of Intent to Sole Source for Coupled Device Detector Camera System - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Notice of Intent to Sole Source for Coupled Device Detector Camera System. This tender is published on USARFP under UST Ref No: 132131557 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-29.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.

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