- Country: USA
- Summary: Notice of Intent to Sole Source: Scanning Threshold Particle Counter
- UST Ref No: 113166355
- Deadline: 28 Jan 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NB305000-25-00535
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- Description:
- Description
Announcement Type: Special NoticeClassification Code: 6695
Announcement Number: NB305000-25-00535 (NOI)
Subject: Notice of Intent to Noncompetitively Acquire Advanced Chemical Metrology for Semiconductor Cleaning Chemicals: Organic Contaminants, Native Particles and Precursors, and Rapid Particle and Impurity Characterization
Semiconductor manufacturing yield enhancement requires ongoing risk analysis of cleaning chemical purity wherein critical contaminants are already at levels difficult or impossible to detect, let alone identify and quantify. Next-generation chips will require even purer materials and advanced metrological capabilities for the detection, identification, and quantification of impurities in semiconductor cleaning chemicals, necessitating a practical roadmap for assessing material purity commensurate with the needs of the next generation in semiconductor manufacturing.
One exemplary system of study is ultra-pure water (UPW) as semiconductor fabrication plants (fabs) can utilize upwards of 3.4 × 107 L d-1 (9 × 106 gal d-1 or ≈ 14 Olympic-size swimming pools) of UPW, and it is used in all wet-processing steps where, to a large extent, the cleanliness, and hence yield, of a wafer is determined by the purity of the water. Further, the International Roadmap for Devices and Systems (IRDS) has identified that a “Lack of proven particle metrology limits the ability to confirm whether UF (ultrafiltration of UPW) is effective in controlling killer size particles down to the critical particle size”.
Aerosol-based testing of UF will require nebulizing and drying a UPW stream to form an aerosol and simultaneously measuring the upstream and downstream particle size distributions and number densities. This aerosolization process directly mimics what occurs on-wafer. These aerosol-based methods are quickly gaining acceptance and NIST research would speed these efforts.
The IRDS roadmap has identified that the size of killer ... - Documents:
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CLICK HERE TO LOGINNotice of Intent to Sole Source: Scanning Threshold Particle Counter - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Notice of Intent to Sole Source: Scanning Threshold Particle Counter. This tender is published on USARFP under UST Ref No: 113166355 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-01-28.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
