- Country: USA
- Summary: Optical Frequency Domain Reflectometer
- UST Ref No: 117759720
- Deadline: 29 Apr 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NIST-FY25-CHIPS-0083
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- Description:
- Description
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The Microsystems and Nanotechnology Division develops micro-/nano-fabrication technologies, devices and novel measurement methods enabled by integrated microsystems.
The research work of the Microsystems and Nanotechnology Division as part of the CHIPS metrology program has a requirement for an optical frequency domain reflectometer to help develop advanced measurement methods and test structures for integrated photonics manufacturing. The need is for a system that covers the telecommunications C and L bands with high spatial resolution and high dynamic range in the analysis of back reflection and transmission signals from photonic integrated circuit components such as resonators, waveguides, couplers, interferometers, and filters. The overall system will be used for spectral measurement of reflection, transmission, and insertion loss.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
Wavelength coverage: at least 1520 nm to 1630 nm Measurement modes: both reflection and transmission Laser source: external bench top unit included and satisfying all of the wavelength... - Documents:
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CLICK HERE TO LOGINOptical Frequency Domain Reflectometer - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Optical Frequency Domain Reflectometer. This tender is published on USARFP under UST Ref No: 117759720 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-04-29.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
