Tender Details

Country: USA
Summary: Photonic probe station
UST Ref No: 110030630
Deadline: 26 Nov 2024
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: NIST-SS25-CHIPS-0022
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Description:
Description
Title: Sources Sought Notice for Photonic probe station
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.

The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The Microsystems and Nanotechnology Division develops micro-/nano-fabrication technologies, devices and novel measurement methods enabled by integrated microsystems.

The National Institute of Standards and Technology (NIST) CHIPS metrology program has a requirement for a photonic probestation to develop advanced measurement methods and test structures for integrated photonics manufacturing. The need is for automated and flexible electro-optic probing of multiple photonic test structures at diel level. Custom photonic measurements will include swept wavelength spectroscopy and measuring time and frequency domain response to modulated optical and electrical stimuli.

NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
Automated probe station for die level characterization of integrated photonic devices.

Physical Die mounting Die size up to at least 20 mm x 20 mm reconfigurable for other die sizes, held by vacuum ports Tip tilt and z rotation over at least +/- 5 degrees Z rotation moto...
Documents:

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Photonic probe station - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Photonic probe station. This tender is published on USARFP under UST Ref No: 110030630 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2024-11-26.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.