Tender Details

Country: USA
Summary: Scanning Electron Microscope
UST Ref No: 116542314
Deadline: 26 Mar 2025
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: SEM
Purchaser's Detail:
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Description:
Description
SOURCES SOUGHT: THIS IS NOT A NOTICE OF REQUEST FOR QUOTATION BUT INFORMATION AND PLANNING PURPOSES ONLY! This notice does not constitute a commitment by the Government. All information submitted in response to this announcement is voluntary and the Government will not pay for information requested nor will it compensate any respondent for any cost incurred in developing information provided to the Government.
The North American Industry Classification Systems (NAICS) Code proposed is 334516. The size standard for the NAICS is 1,000 employees.
The requirement is to provide the United States Air Force Academy (USAFA) with a Scanning Electron Microscope.
Salient Characteristics:
At a minimum, the equipment must include:
• Electron source must be Schottky-type Field Emission Gun• Resolution in High Vacuum (HV) mode must be ≤ 1.2 nm at ≥20 kV acceleration voltage. • Resolution in Low Vacuum (LV) mode must be ≤ 2.0 nm at 15-30 kV • Accelerating voltage operational range: 500 V to ≥ 30 kV. • Probe current range must include at least 100 pA to ≥300 nA, continuously adjustable. • Magnification range: o Minimum magnification ≤ 5xo Maximum magnification ≥ 1,000,000x• Operational modes must include both High Vacuum (HV) and Low Vacuum (LV) modes. • Chamber size and stage capabilities: o Motorized, 5-axis stage with minimum travel range: X ≥ 80 mm, Y ≥ 60 mm, Z ≥ 50 mmo Tilt capability: at least -10° to +80° continuouslyo Rotation capability: continuous 360 degrees• Automated vacuum sequencing with oil-free vacuum pumps.
Detectors:• Must include an Everhart-Thornley type Secondary Electron (SE) detector. • Must include Backscattered Electron (BSE) detector capable of live compositional and topographical imaging. • Energy Dispersive Spectroscopy (EDS) detector: o Silicon Drift Detector (SDD) with ≥ 30 mm² active areao Energy resolution ≤130 eV (Mn-Kα) • Includes all EDS software allowing elemental mapping and quantification.
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Documents:

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Scanning Electron Microscope - USA Tender

The DEPT OF DEFENSE | DEPT OF THE AIR FORCE, a Government sector organization in USA, has announced a new tender for Scanning Electron Microscope. This tender is published on USARFP under UST Ref No: 116542314 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-03-26.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.