- Country: USA
- Summary: Scanning electron microscope
- UST Ref No: 125009434
- Deadline: 29 Aug 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: FA860125Q0168
- Purchaser's Detail:Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details.
- Description:
- Description
The Air Force Life Cycle Management Center, Base Support Branch (AFLCMC/PZIBB) at Wright-Patterson Air Force Base (WPAFB), OH intends to award a sole source contract to:
NANOSCIENCE INSTUMENTS INC.
10008 S 51ST ST
PHOENIX, ARIZONA 85044-5223
This requirement is for the following:
CLIN
Item
Quantity
CLIN 0001
Table Mounted Scanning Electron Microscope and required accessories
1 Each
CLIN 0002
Installation/Setup/Qualification
1 Each
CLIN 0003
On-Site Training
1 Each
The contract will be a Firm Fixed Price (FFP) Commercial Purchase Order and carried out as a sole source action (not competitively awarded). The statutory authority which permits other than full and open competition for this acquisition is 10 United States Code (USC) 2304 (c) (1), as implemented by FAR 13.106-1(b). This authority is supported by an approved Single Source Justification (See Attachment 2). The applicable NAICS code is 334516 Analytical Laboratory Instrument Manufacturing. This NAICS code has a small business size standard of 1,000 employees.
The Aerospace Fuels Laboratory (AFPET/PTPLH) located at Cape Canaveral Space Force Station requires one (1) desktop scanning electron microscope, with energy dispersive spectrometer, and secondary electron detector configured for automated analysis. Four (4) of the standard 47 mm filter membranes represent the analysis of failing filters from the prime and backup sample - each failure is confirmed with a retest, which would result in 4 filters for a single sample. Automation capability allows for analyzation of these filters unattended overnight - saving over 800-man hours that can be efficiently used elsewhere. to minimize costs and maximize mission reliability, a cerium or lanthanum source is required. Replacing tungsten filaments, the alternative, carries a significant burden. Tungsten filaments typically ... - Documents:
SSJ-Scanning-Electron-Redacted-21-Aug-2025.pdf
Intent-to-Sole-Source_SEM_CO-Reviewed.docx
If you are registered member, kindly login to view full details of this tender notice:
CLICK HERE TO LOGINScanning electron microscope - USA Tender
The DEPT OF DEFENSE | DEPT OF THE AIR FORCE, a Government sector organization in USA, has announced a new tender for Scanning electron microscope. This tender is published on USARFP under UST Ref No: 125009434 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-08-29.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
