Tender Details

Country: USA
Summary: Scanning Microwave Impedance Microscopy (sMIM) Cypher S kit for a sMIM interface on Vero Atomic Force Microscopes (AFM).
UST Ref No: 123679357
Deadline: 13 Aug 2025
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: NB643090-25-02343
Purchaser's Detail:
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Description:
Description
FBO ANNOUNCEMENT: PRESOLICITATION NOTICE, NOTICE OF INTENT
ACTION CODE: SPECIAL NOTICE
SUBJECT: Sole source - Scanning Microwave Impedance Microscopy (sMIM) Cypher S kit for a sMIM interface on Vero Atomic Force Microscopes (AFM).
SOLICITATION NUMBER: NB643090-25-02343
RESPONSE DATE: 8/13/25
DESCRIPTION:
The National Institute of Standards and Technology, Materials Measurement Science Division (Division 643) of NIST/MML is engaged in a combination of fundamental research, standards production, and applied science and engineering. This work aims to foster innovation in U.S. industry and meet the measurement science needs of our various agency partners. Among its many projects, it focuses on developing nanoscale electrical and mechanical measurement methodologies for characterizing material properties. These methodologies are essential for understanding and advancing the fabrication of semiconductor devices. Many of these characterizations are performed on Atomic Force Microscopes (AFM) like an existing Vero AFM (Oxford Instruments Asylum Research). We have an extensive suite of capabilities on this Vero AFM, including nanoscale electric (current, surface potential, capacitance) and mechanical (various elastic and plastic) capabilities. In some projects, we need to add nanoscale impedance characterization to complement our existing characterizations and have a more compelling understanding of the material properties that we measure. This nanoscale impedance will provide measurements of permittivity and conductivity at the nanoscale, also enabling the identification of dopant polarity (n-type or p-type) and quantification of the carrier dopant levels from intrinsic silicon to 1E20 cm^-3, regardless of the type and species of the dopant. The impedance characterization can be combined with other nano-electric and mechanical AFM measurements, offering innovative ways to investigate domains and interfaces with varying conductivity an...
Documents:

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Scanning Microwave Impedance Microscopy (sMIM) Cypher S kit for a sMIM interface on Vero Atomic Force Microscopes (AFM). - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Scanning Microwave Impedance Microscopy (sMIM) Cypher S kit for a sMIM interface on Vero Atomic Force Microscopes (AFM).. This tender is published on USARFP under UST Ref No: 123679357 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-08-13.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.