Tender Details

Country: USA
Summary: Sources Sought Notice for CHIPS RD Optical frequency comb, Control electronics
UST Ref No: 132010122
Deadline: 26 Dec 2025
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: NIST-SS26-CHIPS-52
Purchaser's Detail:
Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details. Login to see full purchaser details.
Login to see details
Description:
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs.
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
The CHIPS Metrology Program includes research in Grand Challenge 5, Modeling/Simulating Semiconductor Manufacturing Processes. To address this Grand Challenge, the project RF Waveform and Rapid Frequency-Comb Diagnostics for Plasma Etching seeks to purchase a Mid-Infrared Femtosecond Laser Source, Femtosecond Laser Control Electronics, and an Optical Frequency Reference, quantity one (1) each. The laser system and optical reference will enable the application of novel optical diagnostics like broadband laser spectroscopy to the study of chemical transformations in key plasma etching processes.
Plasma etching—performed across the semiconductor manufacturing ecosystem—is a highly nonlinear process involving arbitrary radiofrequency (RF) waveforms, dynamic electrical properties, and complex chemistry in a confined non-equilibrium environment. Metrology tools are needed to better correlate reactor inputs with etching outcomes, and to precisely evaluate consistency across plasma etching tools. To do so, we will develop µs time-resolved frequency comb diagnostics to meet industry needs including reliable in-situ monitoring of plasma chemistry and real-time data generation for intelligent design of next-generation plasma etching processes. This requires a mid-infrared femtosecond laser system (laser sour...
Documents:

If you are registered member, kindly login to view full details of this tender notice:

Sources Sought Notice for CHIPS RD Optical frequency comb, Control electronics - USA Tender

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Sources Sought Notice for CHIPS RD Optical frequency comb, Control electronics. This tender is published on USARFP under UST Ref No: 132010122 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-12-26.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.