- Country: USA
- Summary: Sources Sought Notice for CHIPS Semiconductor Electronics Test System
- UST Ref No: 123686628
- Deadline: 13 Aug 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: NIST-SS25-75
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- Description:
- Description
Notice ID Number NIST-SS25-75
Title: Sources Sought Notice for CHIPS Semiconductor Electronics Test System
BACKGROUND
The National Institute of Standards and Technology (NIST), as part of the CHIPS Act, is engaged in metrology research and development to promote innovation and industrial competitiveness in U.S. semiconductor device manufacturing. NIST has identified seven Grand Challenges in metrology research and development that require critical attention. As part of efforts to advance metrology tools and measurement science for Metrology for Materials Purity, Properties, and Provenance (Grand Challenge 1), NIST requires instruments for measurement of semiconductor microelectronic devices and their constituent materials.
As part of this program to characterize two-dimensional and wide bandgap materials, NIST requires a semiconductor electronics test system to allow for lab scale testing of test structures and devices to evaluate material performance.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
Line Item 0001:
Description: Power Device Analyzer/Curve Tracer Mainframe with integrated SMUs
Quantity: 1
Technical Specifications Power Device Analyzer/Curve Tracer Mainframe Includes enhanced care plan and warranty for 5 years with less than 2 business hour remote technical support response times, repair turnaround or response time of less than 7 business days, includes calibration services with less than 5 business day turnaround and regular firmware releases. Includes one medium power source/measure unit (SMU) Includes one high voltage SMU Includes two medium current SMUs Includes a multi-frequency capacitance measurement unit, Includes all necessary cables and connection tees including A 3 m cable 60 Hz line frequency Coaxial tee male-B... - Documents:
Sources-Sought-Notice-NIST-SS25-75.pdf
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CLICK HERE TO LOGINSources Sought Notice for CHIPS Semiconductor Electronics Test System - USA Tender
The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, a Government sector organization in USA, has announced a new tender for Sources Sought Notice for CHIPS Semiconductor Electronics Test System. This tender is published on USARFP under UST Ref No: 123686628 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-08-13.
The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
